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SE310

3D Optical Profiler

In-situ thickness and PL monitoring during vacuum drying for perovskite and thin-film process development. Observe film evolution as solvent is removed — an observation point between wet coating and finished-film inspection.

SE310 3D Optical Profiler
SE310 3D Optical Profiler

3D Optical Profiling for Surface and Coating Analysis

This SE310 configuration is an offline 3D optical profiler designed to capture surface geometry without contacting the sample. It is intended for laboratory analysis where engineers need depth information in addition to conventional 2D images.

Measurement Principle : The system uses optical triangulation / light-section measurement to reconstruct three-dimensional surface information.

What It Can Investigate : Surface morphology, Height variation, Coating structures, Surface defects, Step structures, Local non-uniformity

Typical Applications : Thin-film research, Coating development, Semiconductor R&D, PV materials, Surface inspection, Failure analysis

Why 3D? : A 2D image tells you where a feature appears. 3D profiling adds information about its height, depth and geometry.

SE310 3D Optical Profiler | High Resolution Surface Measurement — Techcess Solutions