SE10
Portable PL Metrology Instrument
Integrated EPL mapping, AOI and degradation inspection for photovoltaic thin-film development. Examine luminescence, surface defects and degradation-related behavior within one workflow for R&D, quality evaluation and process investigation.
Portable Photoluminescence Measurement for Thin-Film R&D
SE10 is a compact photoluminescence measurement system designed for laboratory research and material development. It provides a practical way to evaluate the luminescence response of thin-film samples during early-stage process development, material screening and sample comparison. Rather than requiring a large inspection platform for every measurement, SE10 is intended for situations where researchers need a flexible PL measurement tool close to the laboratory workflow.
What SE10 Measures : Photoluminescence (PL), PL response comparison, Thin-film optical behavior, Sample-to-sample variation
Typical Applications : Perovskite material research, Thin-film PV development, Semiconductor materials, Display materials, University research laboratories, Process development, Failure analysis
Why PL Measurement Matters : Photoluminescence provides information about how a material responds optically after excitation. Comparing PL results across samples or process conditions can help researchers identify changes in material behavior and evaluate whether a process modification has produced a measurable difference.
Measurement Workflow : Sample Preparation → PL Measurement → Image / Spectrum Analysis → Sample Comparison → Process Optimization
Suitable For : R&D Laboratories · Universities · Material Scientists · Process Engineers
Specifications : Measurement configuration and detailed performance specifications should be confirmed according to the intended material system and sample geometry.
