SE600X
Inline perovskite thickness, PL and T&R
PV module light-degradation tester for IEC-oriented light-soak and reliability studies. Combines controlled irradiation with intelligent temperature management, with upgrade paths for sample size and channel count as test volume grows.
Inline Perovskite Metrology for Full-Stack Film Monitoring
SE600X is designed for production environments where perovskite film properties need to be monitored without removing samples from the manufacturing line. It combines thickness measurement with optical and photoluminescence information, providing a broader view of the film than thickness-only inspection.
SE600X is designed for production environments where perovskite film properties need to be monitored without removing samples from the manufacturing line. It combines thickness measurement with optical and photoluminescence information, providing a broader view of the film than thickness-only inspection.
Measurement Outputs : Thickness, Absorption, Reflectance, Transmittance, Photoluminescence, Band gap, PL peak intensity, PL peak position, FWHM
Why Multiple Outputs? : A perovskite film can have the expected thickness while showing differences in optical or luminescence behavior. SE600X provides several measurement outputs within one production-line workflow.
Production Use : SE600X can support: Coating Monitoring → Film Characterization → Uniformity Evaluation → Process Investigation → Quality Control
Typical Applications : Perovskite PV, Full-stack film monitoring, Inline coating inspection, Process development, Production quality control
Integration Considerations : For a production deployment, the measurement configuration should be evaluated against: Substrate size, Line speed, Film stack, Measurement points, Required outputs, Communication architecture
