Wide-Band Optical Film Monitoring from UV to NIR

SE31-FM is designed for optical-film processes where engineers need transmission and reflection information across a broad spectral range. Its wide-band configuration allows the measurement system to capture optical behavior from visible wavelengths into the near-infrared region.

Measurement Modes : Transmission, Reflection, Optical film thickness monitoring, Spectral analysis

Compatible Materials : Published applications include optical-film systems involving materials such as: SiO₂, MgF₂, Al₂O₃, Ta₂O₅, Nb₂O₅, TiO₂, Si₃N₄

Typical Applications : Optical coatings, Semiconductor films, Photovoltaic films, Flexible electronics, Thin-film R&D

Wide Spectral Coverage : The broad visible-to-near-infrared range allows engineers to investigate optical behavior across a wider portion of the spectrum. This makes the system useful for applications where a narrow-band measurement would not provide sufficient information.