SE31
Slot die wet film metrology module
Perovskite (PVK) MPPT testing system with an A+A+A+ multi-band LED light source. Designed for maximum-power-point tracking and stability evaluation under defined spectral and irradiance conditions for next-generation cell research.
In-Situ Wet-Film Monitoring During Slot-Die Coating
SE31 is designed to monitor wet-film thickness and reflectance directly at the slot-die coating head. The objective is to obtain process information while coating is taking place, rather than waiting for an offline measurement after the film has been deposited.
Measurement Outputs : Wet-film thickness, Reflectance
Process Position : SE31 is installed at the coating head. This makes it suitable for process-development environments where engineers need to understand how coating conditions affect the wet film as it is being formed.
Integration : The published configuration supports: Coating-head installation, Local computing, Ethernet connection, SDK integration, Start/stop signals from the slot-die machine
Typical Applications : Perovskite coating, Slot-die coating, Thin-film PV, Pilot production, Coating process development
Why Measure Before Drying? : Once a film reaches the next process stage, it may be too late to investigate the original coating condition. Wet-film measurement creates an earlier measurement point in the process chain.
Process Workflow : Coating → Wet-Film Measurement → Process Feedback → Drying → Final Film
Configuration Note : TDM currently publishes the measurement functions and integration architecture for SE31 but does not publish a universal numerical thickness range.
